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1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Leveraging data analytics, patterning simulations and metrology models to enhance CD metrology accuracy for advanced IC nodes

Cain, Jason P., Sanchez, Martha I., Rana, Narender, Zhang, Yunlin, Kagalwala, Taher, Hu, Lin, Bailey, Todd

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

2

Measuring self-aligned quadruple patterning pitch walking with scatterometry-based metrology utilizing virtual reference

Kagalwala, Taher, Vaid, Alok, Mahendrakar, Sridhar, Lenahan, Michael, Fang, Fang, Isbester, Paul, Shifrin, Michael, Etzioni, Yoav, Cepler, Aron, Yellai, Naren, Dasari, Prasad, Bozdog, Cornel

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2016

Language:

english

File:

PDF, 2.76 MB

english, 2016

3

Improved performance of phosphonated carbon nanotube–polybenzimidazole composite membranes in proton exchange membrane fuel cells

Kannan, Ramaiyan, Kagalwala, Husain N., Chaudhari, Harshal D., Kharul, Ulhas K., Kurungot, Sreekumar, Pillai, Vijayamohanan K.

Journal:

Journal of Materials Chemistry

Year:

2011

Language:

english

File:

PDF, 560 KB

english, 2011

4

Transient analysis of distribution class adaptive VAr compensators: simulation and field test results

Kagalwala, R.A., Venkata, S.S., El-Sharkawi, M.A., Butler, N.G., Van Leuven, A., Rodriguez, A.P., Kerszenbaum, I., Smith, D.

Journal:

IEEE Transactions on Power Delivery

Year:

1995

Language:

english

File:

PDF, 695 KB

english, 1995

5

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Optical metrology strategies for inline 7nm CMOS logic product control

Sanchez, Martha I., Ukraintsev, Vladimir A., Lenahan, Michael, Mahendrakar, Sridhar, Vaid, Alok, Kagalwala, Taher, Venkataraman, Kartik, Hu, Dawei, Di, Ming, Song, Da, Camp, Janay, Ren, Zhou, Yoon, Na

Year:

2017

Language:

english

File:

PDF, 1.08 MB

english, 2017

6

Electromagnetically induced transparency in inhomogeneously broadened solid media

Fan, H. Q., Kagalwala, K. H., Polyakov, S. V., Migdall, A. L., Goldschmidt, E. A.

Journal:

Physical Review A

Year:

2019

Language:

english

File:

PDF, 1.08 MB

english, 2019

7

Leveraging advanced data analytics, machine learning, and metrology models to enable critical dimension metrology solutions for advanced integrated circuit nodes

Rana, Narender, Zhang, Yunlin, Kagalwala, Taher, Bailey, Todd

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2014

Language:

english

File:

PDF, 2.83 MB

english, 2014

8

[IEEE ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - San Diego, CA, USA (30 May-1 June 2002)] ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258) - Enhanced thermal management by direct water spray of high-voltage, high power devices in a three-phase, 18-hp AC motor drive demonstration

Shaw, M.C., Waldrop, J.R., Chandrasekaran, S., Kagalwala, B., Jing, X., Brown, E.R., Dhir, V.J., Fabbeo, M.

Year:

2002

Language:

english

File:

PDF, 975 KB

english, 2002

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Advanced applications of scatterometry based optical metrology

Sanchez, Martha I., Ukraintsev, Vladimir A., Dixit, Dhairya, Keller, Nick, Kagalwala, Taher, Recchia, Fiona, Lifshitz, Yevgeny, Elia, Alexander, Todi, Vinit, Fronheiser, Jody, Vaid, Alok

Year:

2017

Language:

english

File:

PDF, 871 KB

english, 2017

10

Diagnostic approach to coarse facies

T. Y. Kagalwala, B. A. Bharucha, R. D. Khare, N. B. Kumta

Journal:

Indian Journal of Pediatrics

Year:

1988

Language:

english

File:

PDF, 507 KB

english, 1988

11

Embryology

Gandhi, G., Allahbadia, G., Kagalwala, S., Allahbadia, A., Ramesh, S., Patel, K., Hinduja, R., Chipkar, V., Madne, M., Ramani, R., Joo, J. K., Jeung, J. E., Go, K. R., Lee, K. S., Goto, H., Hashimoto,

Journal:

Human Reproduction

Year:

2013

Language:

english

File:

PDF, 700 KB

english, 2013

12

REST–miR-21–SOX2 axis maintains pluripotency in E14Tg2a.4 embryonic stem cells

Singh, Sanjay K., Marisetty, Anantha, Sathyan, Pratheesh, Kagalwala, Mohamedi, Zhao, Zhaoyang, Majumder, Sadhan

Journal:

Stem Cell Research

Year:

2015

Language:

english

File:

PDF, 1.17 MB

english, 2015

13

Child with prolonged leg pain and bruising

Bailey, Emma, Ali, Alaa, Kagalwala, Fatima

Journal:

Archives of Disease in Childhood - Education and Practice

Year:

2020

File:

PDF, 347 KB

2020

14

REST maintains self-renewal and pluripotency of embryonic stem cells

Singh, Sanjay K., Kagalwala, Mohamedi N., Parker-Thornburg, Jan, Adams, Henry, Majumder, Sadhan

Journal:

Year:

2008

Language:

english

File:

PDF, 461 KB

english, 2008

15

Visible-Light-Driven Alcohol Dehydrogenation with a Rhodium Catalyst

Kagalwala, Husain N., Maurer, Andrew B., Mills, Isaac N., Bernhard, Stefan

Journal:

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

16

Correspondence

Thakre, Rhishikesh, Patil, P. S., Kagalwala, Taher

Journal:

Indian Pediatrics

Year:

2018

Language:

english

File:

PDF, 246 KB

english, 2018

17

P45 Macrophage activation syndrome: experience from a tertiary referral centre

L Pinto, F Kagalwala, S Singh, C Balakrishnan, SV Prabhu, S Khodaiji

Journal:

Indian Journal of Rheumatology

Year:

2006

Language:

english

File:

PDF, 47 KB

english, 2006

18

Photocatalytic Hydrogen Generation System Using a Nickel-Thiolate Hexameric Cluster

Kagalwala, Husain N., Gottlieb, Eric, Li, Gao, Li, Tao, Jin, Rongchao, Bernhard, Stefan

Journal:

Inorganic Chemistry

Year:

2013

Language:

english

File:

PDF, 540 KB

english, 2013

19

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - High throughput and dense sampling metrology for process control

Sanchez, Martha I., Ukraintsev, Vladimir A., Sun, Lei, Kohyama, Tsunehito, Takeda, Kuniaki, Nozawa, Hiroto, Asakawa, Yuji, Kagalwala, Taher, Lobb, Granger, Mont, Frank, Dai, Xintuo, Pal, Shyam, Wang,

Year:

2017

Language:

english

File:

PDF, 916 KB

english, 2017

20

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Improving Metrology Fleet KPIs for Advanced Foundry Manufacturing

Kagalwala, Taher, Timoney, Padraig, Fiege, Ronald, Emans, Jason, Hughes, Timothy, Elia, Alexander, Vaid, Alok, Emans, Susan, Vilge, Benny, Cheng, Marjorie, Kang, Charles, Zingerman, Darren, Drayton, K

Year:

2019

Language:

english

File:

PDF, 1.25 MB

english, 2019

21

Android Based Assistive Toolkit For Alzheimer

Pirani, Er. Zainab, Bulakiwala, Farheen, Kagalwala, Murtaza, Kalolwala, Murtuzaali, Raina, Suraj

Journal:

Procedia Computer Science

Year:

2016

Language:

english

File:

PDF, 358 KB

english, 2016

22

Evidence for Oxidative Decay of a Ru-Bound Ligand during Catalyzed Water Oxidation

Kagalwala, Husain N., Tong, Lianpeng, Zong, Ruifa, Kohler, Lars, Ahlquist, Mårten S. G., Fan, Ting, Gagnon, Kevin J., Thummel, Randolph P.

Journal:

Year:

2017

Language:

english

File:

PDF, 1.62 MB

english, 2017

23

Light-Driven Hydrogen Generation from Microemulsions Using Metallosurfactant Catalysts and Oxalic Acid

Kagalwala, Husain N., Chirdon, Danielle N., Mills, Isaac N., Budwal, Nikita, Bernhard, Stefan

Journal:

Inorganic Chemistry

Year:

2017

Language:

english

File:

PDF, 2.98 MB

english, 2017

24

Bell's measure in classical optical coherence

Kagalwala, Kumel H., Di Giuseppe, Giovanni, Abouraddy, Ayman F., Saleh, Bahaa E. A.

Journal:

Nature Photonics

Year:

2012

Language:

english

File:

PDF, 1.29 MB

english, 2012

25

[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - MBIR characterization of Photosensitive Polyimide in high volume manufacturing

Kagalwala, Taher E., Erwin, Brian M., Calero-DdelC, Victoria L., Brovman, Yuri M., Hoglund, Jonny

Year:

2014

Language:

english

File:

PDF, 579 KB

english, 2014

26

Dynamic Status of REST in the Mouse ESC Pluripotency Network

Singh, Sanjay K., Veo, Bethany L., Kagalwala, Mohamedi N., Shi, Weiwei, Liang, Shoudan, Majumder, Sadhan, Cooney, Austin John

Journal:

Year:

2012

Language:

english

File:

PDF, 770 KB

english, 2012

27

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Characterization of Overlay and Tilt in Advanced Technology Nodes using Scatterometry

Dixit, Dhairya, Dey, Sonal, Kagalwala, Taher, Timoney, Padraig, Ramnath, Yudesh, Elia, Alexander, Paranjape, Ninad, Keller, Nick, Vaid, Alok

Year:

2019

File:

PDF, 2.53 MB

2019

28

Singh et al. reply

Singh, Sanjay K., Kagalwala, Mohamedi N., Parker-Thornburg, Jan, Adams, Henry, Majumder, Sadhan

Journal:

Year:

2010

Language:

english

File:

PDF, 148 KB

english, 2010

29

Singh et al. reply

Singh, Sanjay K., Kagalwala, Mohamedi N., Parker-Thornburg, Jan, Adams, Henry, Majumder, Sadhan

Journal:

Year:

2009

Language:

english

File:

PDF, 293 KB

english, 2009

30

Stemness Is Only a State of the Cell

Kagalwala, M.N., Singh, S.K., Majumder, S.

Journal:

Cold Spring Harbor Symposia on Quantitative Biology

Year:

2008

Language:

english

File:

PDF, 222 KB

english, 2008

31

Reconstructing specimens using DIC microscope images

Kagalwala, F., Kanade, T.

Journal:

IEEE Transactions on Systems Man and Cybernetics Part B (Cybernetics)

Year:

2003

Language:

english

File:

PDF, 2.48 MB

english, 2003

32

[IEEE 2007 IEEE International Conference on Signal Processing and Communications - Dubai, United Arab Emirates (2007.11.24-2007.11.27)] 2007 IEEE International Conference on Signal Processing and Communications - Free-Space Optics Channel Characterization under UAE Weather Conditions

Raja, Adnan R., Kagalwala, Quaid J., Landolsi, Taha, El-Tarhuni, Mohamed

Year:

2007

Language:

english

File:

PDF, 3.89 MB

english, 2007

33

[IEEE Comput. Soc IEEE International Symposium on Bio-Informatics and Biomedical Engineering - Arlington, VA, USA (8-10 Nov. 2000)] Proceedings IEEE International Symposium on Bio-Informatics and Biomedical Engineering - Reconstructing specimens using DIC microscope images

Kagalwala, F., Kanade, T.

Year:

2000

Language:

english

File:

PDF, 963 KB

english, 2000

34

[IEEE 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2015.5.3-2015.5.6)] 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Integrated metrology's role in Gas Cluster Ion Beam etch

Kagalwala, Taher, Dasaka, Ravi, Aquilino, Michael, Economikos, Laertis, Cepler, Aron, Kang, Charles, Yellai, Naren

Year:

2015

Language:

english

File:

PDF, 505 KB

english, 2015

35

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Complex metrology on 3D structures using multi-channel OCD

Sanchez, Martha I., Ukraintsev, Vladimir A., Kagalwala, Taher, Mahendrakar, Sridhar, Vaid, Alok, Isbester, Paul K., Cepler, Aron, Kang, Charles, Yellai, Naren, Sendelbach, Matthew, Ko, Mihael, Ilgayev

Year:

2017

Language:

english

File:

PDF, 912 KB

english, 2017

36

The Dpb4 Subunit of ISW2 Is Anchored to Extranucleosomal DNA

Dang, W., Kagalwala, M. N., Bartholomew, B.

Journal:

Journal of Biological Chemistry

Year:

2007

Language:

english

File:

PDF, 1.03 MB

english, 2007

37

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Quantum Information and Computation IX - Implementing an optical CNOT using spatial parity qubits

Kagalwala, K., Donkor, Eric, Pirich, Andrew R., Di Giuseppe, G., Abouraddy, A. F., Brandt, Howard E., Saleh, B. E. A.

Year:

2011

Language:

english

File:

PDF, 1.75 MB

english, 2011

38

Optical coherency matrix tomography

Kagalwala, Kumel H., Kondakci, H. Esat, Abouraddy, Ayman F., Saleh, Bahaa E. A.

Journal:

Scientific Reports

Year:

2015

Language:

english

File:

PDF, 1.69 MB

english, 2015

39

P155 Insignificant brain abnormalities in neurologically normal children with headache

M.A.S. Ahmed, F. Kagalwala, S. Chawda, K. Ibrahim

Journal:

European Journal of Paediatric Neurology

Year:

2009

Language:

english

File:

PDF, 41 KB

english, 2009

40

[Opt. Soc. America Technical Digest. Summaries of papers presented at the Quantum Electronics and Laser Science Conference - Baltimore, MD, USA (23-28 May 1999)] Technical Digest. Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference - Computational model of DIC microscopy for reconstructing 3-D specimens: from observations to measurements

Kagalwala, F., Kanade, T., Lanni, F.

Year:

1999

Language:

english

File:

PDF, 275 KB

english, 1999

41

G541(P) Improving the efficiency of procedure lists in paediatric haematology-oncology - a quality improvement project

Kagalwala, F., Salam, H., Grandage, V., Burgess, H., Brown, L.

Journal:

Archives of Disease in Childhood

Year:

2015

Language:

english

File:

PDF, 320 KB

english, 2015

42

The mucopolysaccharidoses: A study of 48 cases

T. Y. Kagalwala, B. A. Bharucha, N. B. Kumta, G. G. Naik

Journal:

Indian Journal of Pediatrics

Year:

1988

Language:

english

File:

PDF, 368 KB

english, 1988

43

Conformational Changes Associated with Template Commitment in ATP-Dependent Chromatin Remodeling by ISW2

Vamsi K. Gangaraju, Punit Prasad, Ali Srour, Mohamedi N. Kagalwala, Blaine Bartholomew

Journal:

Year:

2009

Language:

english

File:

PDF, 3.51 MB

english, 2009

44

Intraoperative Transesophageal Echocardiographic Evidence of SVC Compression by a Bronchogenic Cyst

Bhatt, Himani V., Kagalwala, Din Z., Fischer, Gregory W.

Journal:

Journal of Cardiothoracic and Vascular Anesthesia

Year:

2014

Language:

english

File:

PDF, 954 KB

english, 2014

45

[IEEE Comput. Soc IEEE Computer Society Workshop on Photometric Modeling for Computer Vision and Graphics - Fort Collins, CO, USA (22 June 1999)] Proceedings Workshop on Photometric Modeling for Computer Vision and Graphics (Cat. No.PR00271) - Simulating DIC microscope images: from physical principles to a computational model

Kagalwala, F., Kanade, T.

Year:

1999

Language:

english

File:

PDF, 617 KB

english, 1999

46

REST Regulates Non-Cell-Autonomous Neuronal Differentiation and Maturation of Neural Progenitor Cells via Secretogranin II

Kim, H. J., Denli, A. M., Wright, R., Baul, T. D., Clemenson, G. D., Morcos, A. S., Zhao, C., Schafer, S. T., Gage, F. H., Kagalwala, M. N.

Journal:

Journal of Neuroscience

Year:

2015

Language:

english

File:

PDF, 2.46 MB

english, 2015

47

[Opt. Soc. America Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics - Baltimore, MD, USA (23-28 May 1999)] Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics (IEEE Cat. No.99CH37013) - Computational model of DIC microscopy for reconstructing 3-D specimens: from observations to measurements

Kagalwala, F., Kanade, T., Lanni, F.

Year:

1999

Language:

english

File:

PDF, 310 KB

english, 1999

48

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Characterization of Overlay and Tilt in Advanced Technology Nodes using Scatterometry

Dixit, Dhairya, Dey, Sonal, Kagalwala, Taher, Timoney, Padraig, Ramnath, Yudesh, Elia, Alexander, Paranjape, Ninad, Keller, Nick, Vaid, Alok

Year:

2019

Language:

english

File:

PDF, 2.53 MB

english, 2019

49

[IEEE Comput. Soc. Press 1994 IEEE International Conference on Robotics and Automation - San Diego, CA, USA (8-13 May 1994)] Proceedings of the 1994 IEEE International Conference on Robotics and Automation - Visual robot navigation using flat earth obstacle projection

Bidlack, C., Hampapur, A., Katkere, A., Liqiang Feng,, Kagalwala, F., Kraljevic, T., Pingali, G., Shoval, S., Weymouth, T.

Year:

1994

Language:

english

File:

PDF, 667 KB

english, 1994

50

Two-point optical coherency matrix tomography

Abouraddy, Ayman F., Kagalwala, Kumel H., Saleh, Bahaa E. A.

Journal:

Year:

2014

Language:

english

File:

PDF, 394 KB

english, 2014

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